Hamid H. Butt

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1984

2 Yacoub M. El-Ziq, Hamid H. Butt: Impact of Mixed-Mode Self Test on Life Cycle Cost of VLSI Based Design. ITC 1984: 338-349

1983

1 Yacoub M. El-Ziq, Hamid H. Butt: A Mixed-Mode Built-In Self-Test Technique Using Scan Path and Signature Analysis. ITC 1983: 269-274

1984
2		Yacoub M. El-Ziq, Hamid H. Butt: Impact of Mixed-Mode Self Test on Life Cycle Cost of VLSI Based Design. ITC 1984: 338-349
1983
1		Yacoub M. El-Ziq, Hamid H. Butt: A Mixed-Mode Built-In Self-Test Technique Using Scan Path and Signature Analysis. ITC 1983: 269-274

Coauthor Index

1 Yacoub M. El-Ziq [1] [2]