Yashwant K. Malaiya

2008
43	EE	HyunChul Joh, Yashwant K. Malaiya: Seasonality in Vulnerability Discovery in Major Software Systems. ISSRE 2008: 297-298
42	EE	HyunChul Joh, Jinyoo Kim, Yashwant K. Malaiya: Vulnerability Discovery Modeling Using Weibull Distribution. ISSRE 2008: 299-300
41	EE	Omar H. Alhazmi, Yashwant K. Malaiya: Application of Vulnerability Discovery Models to Major Operating Systems. IEEE Transactions on Reliability 57(1): 14-22 (2008)
2007
40	EE	Jinyoo Kim, Yashwant K. Malaiya, Indrakshi Ray: Vulnerability Discovery in Multi-Version Software Systems. HASE 2007: 141-148
39	EE	Omar H. Alhazmi, Yashwant K. Malaiya, Indrajit Ray: Measuring, analyzing and predicting security vulnerabilities in software systems. Computers & Security 26(3): 219-228 (2007)
2006
38		Omar H. Alhazmi, Sung-Whan Woo, Yashwant K. Malaiya: Security vulnerability categories in major software systems. Communication, Network, and Information Security 2006: 138-143
37	EE	Sung-Whan Woo, Omar H. Alhazmi, Yashwant K. Malaiya: Assessing Vulnerabilities in Apache and IIS HTTP Servers. DASC 2006: 103-110
36	EE	Omar H. Alhazmi, Yashwant K. Malaiya: Measuring and Enhancing Prediction Capabilities of Vulnerability Discovery Models for Apache and IIS HTTP Servers. ISSRE 2006: 343-352
35	EE	Ashutosh Sharma, Anura P. Jayasumana, Yashwant K. Malaiya: X-IDDQ: A Novel Defect Detection Technique Using IDDQ Data. VTS 2006: 180-185
2005
34	EE	Artem Sokolov, Alodeep Sanyal, L. Darrell Whitley, Yashwant K. Malaiya: Dynamic power minimization during combinational circuit testing as a traveling salesman problem. Congress on Evolutionary Computation 2005: 1088-1095
33	EE	Omar H. Alhazmi, Yashwant K. Malaiya, Indrajit Ray: Security Vulnerabilities in Software Systems: A Quantitative Perspective. DBSec 2005: 281-294
32	EE	Omar H. Alhazmi, Yashwant K. Malaiya: Modeling the Vulnerability Discovery Process. ISSRE 2005: 129-138
2004
31		Jiao Chen, Yashwant K. Malaiya: Augmenting Test Case Generation Using Statechart. Software Engineering Research and Practice 2004: 608-614
2000
30	EE	Yashwant K. Malaiya, Jason Denton: Module Size Distribution and Defect Density. ISSRE 2000: 62-71
1998
29	EE	Yashwant K. Malaiya, Jason Denton: Estimating the Number of Residual Defects. HASE 1998: 98-
1997
28	EE	Sankaran M. Menon, Yashwant K. Malaiya, Anura P. Jayasumana: Input Pattern Classification for Detection of Stuck-ON and Bridging Faults Using I/sub DDQ/ Testing in BiCMOS and CMOS Circuits. VLSI Design 1997: 545-546
1996
27	EE	Sankaran M. Menon, Anura P. Jayasumana, Yashwant K. Malaiya: Input Pattern Classification for Transistor Level Testing of Bridging Faults in BiCMOS Circuits. Great Lakes Symposium on VLSI 1996: 214-219
1995
26		Anura P. Jayasumana, Yashwant K. Malaiya, Sankaran M. Menon: A Novel High-Speed BiCMOS Domino Logic Family. ISCAS 1995: 21-24
25	EE	Ramanagopal V. Vogety, Yashwant K. Malaiya, Anura P. Jayasumana: Interconnection of FDDI-II networks through an ATM backbone - An analysis. LCN 1995: 150-
1994
24		Sankaran M. Menon, Yashwant K. Malaiya, Anura P. Jayasumana, Carol Q. Tong: The Effect of Built-In Current Sensors (BICS) on Operational and Test Performance. VLSI Design 1994: 187-190
1993
23		Sankaran M. Menon, Anura P. Jayasumana, Yashwant K. Malaiya: Test Generation for BiCMOS Circuits. ISCAS 1993: 1987-1990
22		W. K. Al-Assadi, Yashwant K. Malaiya, Anura P. Jayasumana: Use of Storage Elements as Primitives for Modelling Faults in Synchronous Sequential Circuits. VLSI Design 1993: 118-123
21	EE	Yashwant K. Malaiya, Anneliese von Mayrhauser, Pradip K. Srimani: An Examination of Fault Exposure Ratio. IEEE Trans. Software Eng. 19(11): 1087-1094 (1993)
20	EE	W. K. Al-Assadi, Yashwant K. Malaiya, Anura P. Jayasumana: Faulty behavior of storage elements and its effects on sequential circuits. IEEE Trans. VLSI Syst. 1(4): 446-452 (1993)
1992
19		Yashwant K. Malaiya: Guest Editor's Introduction: VLSI Design 92. IEEE Design & Test of Computers 9(4): 4-5 (1992)
18		Pradip K. Srimani, Yashwant K. Malaiya: Steps to Practical Reliability Meassurement - Guest Editors' Introduction. IEEE Software 9(4): 10-12 (1992)
17		Nachimuthu Karunanithi, Darrell Whitley, Yashwant K. Malaiya: Using Neural Networks in Reliability Prediction. IEEE Software 9(4): 53-59 (1992)
16	EE	Nachimuthu Karunanithi, Darrell Whitley, Yashwant K. Malaiya: Prediction of Software Reliability Using Connectionist Models. IEEE Trans. Software Eng. 18(7): 563-574 (1992)
1991
15		Yashwant K. Malaiya, Pradip K. Srimani: An Introduction to Software Reliability Models. Int. CMG Conference 1991: 1237-1239
14		Yinghua Min, Yashwant K. Malaiya, Boping Jin: Analysis of Detection Capability of Parallel Signature Analyzers. IEEE Trans. Computers 40(9): 1075-1081 (1991)
1990
13	EE	S. Hwang, Rochit Rajsuman, Yashwant K. Malaiya: On the testing of microprogrammed processor. MICRO 1990: 260-266
1989
12	EE	Rochit Rajsuman, Anura P. Jayasumana, Yashwant K. Malaiya: CMOS Stuck-open Fault Detection Using Single Test Patterns. DAC 1989: 714-717
11	EE	Yashwant K. Malaiya: On inherent untestability of unaugmented microprogrammed control. MICRO 1989: 88-96
10	EE	Rochit Rajsuman, Yashwant K. Malaiya, Anura P. Jayasumana: Limitations of switch level analysis for bridging faults. IEEE Trans. on CAD of Integrated Circuits and Systems 8(7): 807-811 (1989)
1988
9	EE	Yashwant K. Malaiya, S. Feng: Design of a testable RISC-to-CISC control architecture. MICRO 1988: 57-59
1987
8	EE	Rochit Rajsuman, Yashwant K. Malaiya, Anura P. Jayasumana: On Accuracy of Switch-Level Modeling of Bridging Faults in Complex Gates. DAC 1987: 244-250
1985
7		Yashwant K. Malaiya: Faults in Microprogrammed and Hardwired Control. ITC 1985: 732
1984
6		Yashwant K. Malaiya, Shoubao Yang: The Coverage Problem for Random Testing. ITC 1984: 237-245
1983
5		Yashwant K. Malaiya, Ramesh Narayanaswamy: Testing for Timing Faults in Synchronous Sequential Integrated Circuits. ITC 1983: 560-573
1981
4		Chi-Chang Liaw, Stephen Y. H. Su, Yashwant K. Malaiya: State Diagram Approach for Functional Testing of Control Section. ITC 1981: 433-446
3		Chi-Chang Liaw, Stephen Y. H. Su, Yashwant K. Malaiya: Test-Experiments for Detection and Location of Intermittent Faults in Sequential Circuits. IEEE Trans. Computers 30(12): 989-995 (1981)
2		Yashwant K. Malaiya, Stephen Y. H. Su: Reliability Measure of Hardware Redundancy Fault-Tolerant Digital Systems with Intermittent Faults. IEEE Trans. Computers 30(8): 600-604 (1981)
1978
1		Stephen Y. H. Su, Israel Koren, Yashwant K. Malaiya: A Continous-Parameter Markov Model and Detection Procedures for Intermittent Faults. IEEE Trans. Computers 27(6): 567-570 (1978)

Coauthor Index

1	W. K. Al-Assadi	[20] [22]
2	Omar H. Alhazmi	[32] [33] [36] [37] [38] [39] [41]
3	Anneliese Amschler Andrews (Anneliese von Mayrhauser)	[21]
4	Jiao Chen	[31]
5	Jason Denton	[29] [30]
6	S. Feng	[9]
7	S. Hwang	[13]
8	Anura P. Jayasumana	[8] [10] [12] [20] [22] [23] [24] [25] [26] [27] [28] [35]
9	Boping Jin	[14]
10	HyunChul Joh	[42] [43]
11	Nachimuthu Karunanithi	[16] [17]
12	Jinyoo Kim	[40] [42]
13	Israel Koren	[1]
14	Chi-Chang Liaw	[3] [4]
15	Sankaran M. Menon	[23] [24] [26] [27] [28]
16	Yinghua Min	[14]
17	Ramesh Narayanaswamy	[5]
18	Rochit Rajsuman	[8] [10] [12] [13]
19	Indrajit Ray	[33] [39]
20	Indrakshi Ray	[40]
21	Alodeep Sanyal	[34]
22	Ashutosh Sharma	[35]
23	Artem Sokolov	[34]
24	Pradip K. Srimani	[15] [18] [21]
25	Stephen Y. H. Su	[1] [2] [3] [4]
26	Carol Q. Tong	[24]
27	Ramanagopal V. Vogety	[25]
28	L. Darrell Whitley (Darrell Whitley)	[16] [17] [34]
29	Sung-Whan Woo	[37] [38]
30	Shoubao Yang	[6]

Colors in the list of coauthors