dblp.uni-trier.dewww.uni-trier.de

Tom W. Williams

List of publications from the DBLP Bibliography Server - FAQ
Coauthor Index - Ask others: ACM DL/Guide - CiteSeer - CSB - Google - MSN - Yahoo

1991
7EEAndré Ivanov, Corot W. Starke, Vinod K. Agarwal, Wilfried Daehn, Matthias Gruetzner, Tom W. Williams: Iterative algorithms for computing aliasing probabilities. IEEE Trans. on CAD of Integrated Circuits and Systems 10(2): 260-265 (1991)
1988
6EELarry Carter, Leendert M. Huisman, Tom W. Williams: TRIM: testability range by ignoring the memory. IEEE Trans. on CAD of Integrated Circuits and Systems 7(1): 38-49 (1988)
5EETom W. Williams, Wilfried Daehn, Matthias Gruetzner, Corot W. Starke: Bounds and analysis of aliasing errors in linear feedback shift registers. IEEE Trans. on CAD of Integrated Circuits and Systems 7(1): 75-83 (1988)
1986
4 Tom W. Williams, Wilfried Daehn, Matthias Gruetzner, Corot W. Starke: Comparison of Aliasing Errors for Primitive and Non-Primitive Polynomials. ITC 1986: 282-289
3 Leendert M. Huisman, Larry Carter, Tom W. Williams: TRIM : Testability Range by Ignoring the Memory. ITC 1986: 474-479
1984
2 Tom W. Williams: Sufficient Testing In A Self-Testing Environment. ITC 1984: 167-173
1982
1 Sumit DasGupta, Prabhakar Goel, Ron G. Walther, Tom W. Williams: A Variation of LSSD and Its Implications on Design and Test Pattern Generation in VLSI. ITC 1982: 63-66

Coauthor Index

1Vinod K. Agarwal [7]
2Larry Carter [3] [6]
3Wilfried Daehn [4] [5] [7]
4Sumit DasGupta [1]
5Prabhakar Goel [1]
6Matthias Gruetzner [4] [5] [7]
7Leendert M. Huisman [3] [6]
8André Ivanov [7]
9Corot W. Starke [4] [5] [7]
10Ron G. Walther [1]

Colors in the list of coauthors

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)