| 1991 |
|---|
| 7 | EE | André Ivanov,
Corot W. Starke,
Vinod K. Agarwal,
Wilfried Daehn,
Matthias Gruetzner,
Tom W. Williams:
Iterative algorithms for computing aliasing probabilities.
IEEE Trans. on CAD of Integrated Circuits and Systems 10(2): 260-265 (1991) |
| 1988 |
|---|
| 6 | EE | Larry Carter,
Leendert M. Huisman,
Tom W. Williams:
TRIM: testability range by ignoring the memory.
IEEE Trans. on CAD of Integrated Circuits and Systems 7(1): 38-49 (1988) |
| 5 | EE | Tom W. Williams,
Wilfried Daehn,
Matthias Gruetzner,
Corot W. Starke:
Bounds and analysis of aliasing errors in linear feedback shift registers.
IEEE Trans. on CAD of Integrated Circuits and Systems 7(1): 75-83 (1988) |
| 1986 |
|---|
| 4 | | Tom W. Williams,
Wilfried Daehn,
Matthias Gruetzner,
Corot W. Starke:
Comparison of Aliasing Errors for Primitive and Non-Primitive Polynomials.
ITC 1986: 282-289 |
| 3 | | Leendert M. Huisman,
Larry Carter,
Tom W. Williams:
TRIM : Testability Range by Ignoring the Memory.
ITC 1986: 474-479 |
| 1984 |
|---|
| 2 | | Tom W. Williams:
Sufficient Testing In A Self-Testing Environment.
ITC 1984: 167-173 |
| 1982 |
|---|
| 1 | | Sumit DasGupta,
Prabhakar Goel,
Ron G. Walther,
Tom W. Williams:
A Variation of LSSD and Its Implications on Design and Test Pattern Generation in VLSI.
ITC 1982: 63-66 |
