| |
| 1997 | ||
|---|---|---|
| 2 | EE | R. Schmid, R. Schmitt, M. Brunner, O. Gessner, M. Sturm: Electron Beam Probing - A Solution for MCM Test and Failure Analysis. J. Electronic Testing 10(1-2): 55-63 (1997) |
| 1984 | ||
| 1 | P. Küollensperger, A. Krupp, M. Sturm, R. Weyl, F. Widulla, F. Wolfgang: Automated Electron Beam Testing of VLSI Circuits. ITC 1984: 550-557 | |
| 1 | M. Brunner | [2] |
| 2 | O. Gessner | [2] |
| 3 | A. Krupp | [1] |
| 4 | P. Küollensperger | [1] |
| 5 | R. Schmid | [2] |
| 6 | R. Schmitt | [2] |
| 7 | R. Weyl | [1] |
| 8 | F. Widulla | [1] |
| 9 | F. Wolfgang | [1] |