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1984 | ||
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2 | Mark A. Myers: DeltaI vs. DeltaY : A Quantitative Analysis of the Trade-offs Between Higher Capital Investment and Higher Yield in PCB Testing. ITC 1984: 8-19 | |
1983 | ||
1 | Mark A. Myers: An Analysis of the Cost and Quality Impact of LSI/VLSI Technology on PCB Test Strategies. ITC 1983: 382-395 |