| |
| 1984 | ||
|---|---|---|
| 2 | Mark A. Myers: DeltaI vs. DeltaY : A Quantitative Analysis of the Trade-offs Between Higher Capital Investment and Higher Yield in PCB Testing. ITC 1984: 8-19 | |
| 1983 | ||
| 1 | Mark A. Myers: An Analysis of the Cost and Quality Impact of LSI/VLSI Technology on PCB Test Strategies. ITC 1983: 382-395 | |