| |
| 1984 | ||
|---|---|---|
| 3 | Brian C. Crosby: Adapting CAE Design Information for In-Circuit Test Generation. ITC 1984: 206-211 | |
| 1983 | ||
| 2 | Brian C. Crosby: FAST Technology In-Circuit Testing Considerations. ITC 1983: 51-56 | |
| 1982 | ||
| 1 | Brian C. Crosby: ECL Board Testing: An In-Circuit Point of View. ITC 1982: 609-614 | |