J. K. Lemke
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1984
1
Charles R. Kime
,
H. H. Kwan
, J. K. Lemke,
Gerald B. Williams
: A Built-In Test Methodology for VLSI Data Paths.
ITC 1984
: 327-337
Coauthor
Index
1
Charles R. Kime
[
1
]
2
H. H. Kwan
[
1
]
3
Gerald B. Williams
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
