| |
| 1986 | ||
|---|---|---|
| 6 | Prabhakar Goel, Chi-Lai Huang, Robert E. Blauth: Application of Parallel Processing to Fault Simulation. ICPP 1986: 785-788 | |
| 1985 | ||
| 5 | Prabhakar Goel, Chi-Lai Huang: Statistical Fault Sampling and Full Fault Simulation. ITC 1985: 801-802 | |
| 1984 | ||
| 4 | Prabhakar Goel: Testability Analysis will not Replace Fault Simulation. ITC 1984: 722-724 | |
| 1982 | ||
| 3 | Sumit DasGupta, Prabhakar Goel, Ron G. Walther, Tom W. Williams: A Variation of LSSD and Its Implications on Design and Test Pattern Generation in VLSI. ITC 1982: 63-66 | |
| 2 | Prabhakar Goel, M. T. McMahon: Electronic Chip-In-Place Test. ITC 1982: 83-91 | |
| 1981 | ||
| 1 | Prabhakar Goel: An Implicit Enumeration Algorithm to Generate Tests for Combinational Logic Circuits. IEEE Trans. Computers 30(3): 215-222 (1981) | |
| 1 | Robert E. Blauth | [6] |
| 2 | Sumit DasGupta | [3] |
| 3 | Chi-Lai Huang | [5] [6] |
| 4 | M. T. McMahon | [2] |
| 5 | Ron G. Walther | [3] |
| 6 | Tom W. Williams | [3] |