Beau R. Wilson Jr.

1984
3		Beau R. Wilson Jr., Eugene R. Hnatek: Problems Encountered in Developing VLSI Test Programs for COT (A Practical Outlook). ITC 1984: 778-788
1982
2		Eugene R. Hnatek, Beau R. Wilson Jr.: An Evaluation of the 2816 EEPROM. ITC 1982: 225-235
1981
1		Beau R. Wilson Jr.: A Method for Testing Subnanosecond ECL. ITC 1981: 393-401

Coauthor Index

1

Eugene R. Hnatek

[2] [3]