Robert S. Broughton

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1984

3 Robert S. Broughton, Michael G. Brashler: The Future is Now: Extending CAE into Test of Custom VLSI. ITC 1984: 462-465

1983

2 Robert S. Broughton: Structured Logic Analysis for Manufacturing Testing. ITC 1983: 538-545

1981

1 Robert S. Broughton: Data Management for Large Memory Device Characterization. ITC 1981: 381-387

1984
3		Robert S. Broughton, Michael G. Brashler: The Future is Now: Extending CAE into Test of Custom VLSI. ITC 1984: 462-465
1983
2		Robert S. Broughton: Structured Logic Analysis for Manufacturing Testing. ITC 1983: 538-545
1981
1		Robert S. Broughton: Data Management for Large Memory Device Characterization. ITC 1981: 381-387

Coauthor Index

1 Michael G. Brashler [3]