| |
| 1984 | ||
|---|---|---|
| 3 | Nobuo Arai, Yoshio Yamanaka: Parallel Testing of Random Logic LSIs. ITC 1984: 827-833 | |
| 1983 | ||
| 2 | Takeshi Shigematsu, Takashi Sakamoto, Yoshio Yamanaka: A New Approach to DC Parameter Measurement in the Day of VLSI. ITC 1983: 362-365 | |
| 1982 | ||
| 1 | Yasutoshi Otani, Eiji Ishiwa, Nobuo Arai, Yoshio Yamanaka: A Pursuit of Superior Cost-Per-Performance in General-Purpose Linear IC Test System. ITC 1982: 105-110 | |
| 1 | Nobuo Arai | [1] [3] |
| 2 | Eiji Ishiwa | [1] |
| 3 | Yasutoshi Otani | [1] |
| 4 | Takashi Sakamoto | [2] |
| 5 | Takeshi Shigematsu | [2] |