| 2009 |
|---|
| 10 | EE | Arvind Kumar,
Balachandran Vaidyanathan,
Krishna C. Jha,
Ravindra K. Ahuja:
Railroad Crew Scheduling.
Encyclopedia of Optimization 2009: 3227-3236 |
| 9 | EE | Arvind Kumar,
Balachandran Vaidyanathan,
Ravindra K. Ahuja:
Railroad Locomotive Scheduling.
Encyclopedia of Optimization 2009: 3236-3245 |
| 2008 |
|---|
| 8 | EE | Arvind Kumar,
Sven Schrader,
Ad Aertsen,
Stefan Rotter:
The High-Conductance State of Cortical Networks.
Neural Computation 20(1): 1-43 (2008) |
| 2007 |
|---|
| 7 | EE | Ralph Meier,
Arvind Kumar,
Andreas Schulze-Bonhage,
Ad Aertsen:
Comparison of dynamical states of random networks with human EEG.
Neurocomputing 70(10-12): 1843-1847 (2007) |
| 6 | EE | Jens Kremkow,
Arvind Kumar,
Stefan Rotter,
Ad Aertsen:
Emergence of population synchrony in a layered network of the cat visual cortex.
Neurocomputing 70(10-12): 2069-2073 (2007) |
| 2006 |
|---|
| 5 | EE | Wilfried Haensch,
Edward J. Nowak,
Robert H. Dennard,
Paul M. Solomon,
Andres Bryant,
Omer H. Dokumaci,
Arvind Kumar,
Xinlin Wang,
Jeffrey B. Johnson,
Massimo V. Fischetti:
Silicon CMOS devices beyond scaling.
IBM Journal of Research and Development 50(4-5): 339-362 (2006) |
| 4 | EE | Anna W. Topol,
Douglas C. La Tulipe Jr.,
Leathen Shi,
David J. Frank,
Kerry Bernstein,
Steven E. Steen,
Arvind Kumar,
Gilbert U. Singco,
Albert M. Young,
Kathryn W. Guarini,
Mei-Kei Ieong:
Three-dimensional integrated circuits.
IBM Journal of Research and Development 50(4-5): 491-506 (2006) |
| 2004 |
|---|
| 3 | EE | Arvind Kumar,
Sandip Tiwari:
Testing and Defect Tolerance: A Rent's Rule Based Analysis and Implications on Nanoelectronics.
DFT 2004: 280-288 |
| 2 | | Arvind Kumar,
Sandip Tiwari:
A power-performance adaptive low voltage analog circuit design using independently controlled double gate CMOS technology.
ISCAS (1) 2004: 197-200 |
| 1 | EE | Arvind Kumar,
Sandip Tiwari:
Defect tolerance for nanocomputer architecture.
SLIP 2004: 89-96 |
