| 2006 |
|---|
| 6 | EE | Tejasvi Das,
Anand Gopalan,
Clyde Washburn,
P. R. Mukund:
Towards Fault-Tolerant RF Front Ends.
J. Electronic Testing 22(4-6): 371-386 (2006) |
| 2005 |
|---|
| 5 | EE | Anand Gopalan,
Tejasvi Das,
Clyde Washburn,
Ponnathpur R. Mukund:
Use of source degeneration for non-intrusive BIST of RF front-end circuits.
ISCAS (5) 2005: 4385-4388 |
| 4 | EE | Anand Gopalan,
Tejasvi Das,
Clyde Washburn,
P. R. Mukund:
An Ultra-Fast, On-Chip BiST for RF Low Noise Amplifiers.
VLSI Design 2005: 485-490 |
| 3 | EE | Anand Gopalan,
Martin Margala,
P. R. Mukund:
A current based self-test methodology for RF front-end circuits.
Microelectronics Journal 36(12): 1091-1102 (2005) |
| 2004 |
|---|
| 2 | EE | Tejasvi Das,
Anand Gopalan,
Clyde Washburn,
P. R. Mukund:
Dynamic Input Match Correction in RF Low Noise Amplifiers.
DFT 2004: 211-219 |
| 1 | EE | Antonija Soldo,
Anand Gopalan,
P. R. Mukund,
Martin Margala:
A Current Sensor for On-Chip, Non-Intrusive Testing of RF Systems.
VLSI Design 2004: 1023-1026 |
