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Anand Gopalan

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2006
6EETejasvi Das, Anand Gopalan, Clyde Washburn, P. R. Mukund: Towards Fault-Tolerant RF Front Ends. J. Electronic Testing 22(4-6): 371-386 (2006)
2005
5EEAnand Gopalan, Tejasvi Das, Clyde Washburn, Ponnathpur R. Mukund: Use of source degeneration for non-intrusive BIST of RF front-end circuits. ISCAS (5) 2005: 4385-4388
4EEAnand Gopalan, Tejasvi Das, Clyde Washburn, P. R. Mukund: An Ultra-Fast, On-Chip BiST for RF Low Noise Amplifiers. VLSI Design 2005: 485-490
3EEAnand Gopalan, Martin Margala, P. R. Mukund: A current based self-test methodology for RF front-end circuits. Microelectronics Journal 36(12): 1091-1102 (2005)
2004
2EETejasvi Das, Anand Gopalan, Clyde Washburn, P. R. Mukund: Dynamic Input Match Correction in RF Low Noise Amplifiers. DFT 2004: 211-219
1EEAntonija Soldo, Anand Gopalan, P. R. Mukund, Martin Margala: A Current Sensor for On-Chip, Non-Intrusive Testing of RF Systems. VLSI Design 2004: 1023-1026

Coauthor Index

1Tejasvi Das [2] [4] [5] [6]
2Martin Margala [1] [3]
3Ponnathpur R. Mukund (P. R. Mukund) [1] [2] [3] [4] [5] [6]
4Antonija Soldo [1]
5Clyde Washburn [2] [4] [5] [6]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)