Gang Zeng

2008
23	EE	Gang Zeng, Luc J. Van Gool: Multi-label image segmentation via point-wise repetition. CVPR 2008
22	EE	Junpei Zushi, Gang Zeng, Hiroyuki Tomiyama, Hiroaki Takada, Koji Inoue: Improved Policies for Drowsy Caches in Embedded Processors. DELTA 2008: 362-367
2007
21	EE	Gang Zeng, Hiroyuki Tomiyama, Hiroaki Takada: A Software Framework for Energy and Performance Tradeoff in Fixed-Priority Hard Real-Time Embedded Systems. EUC 2007: 13-24
20	EE	Gang Zeng, Hiroyuki Tomiyama, Hiroaki Takada: Power Optimization for Embedded System Idle Time in the Presence of Periodic Interrupt Services. IESS 2007: 241-254
19	EE	Pascal Müller, Gang Zeng, Peter Wonka, Luc J. Van Gool: Image-based procedural modeling of facades. ACM Trans. Graph. 26(3): 85 (2007)
18	EE	Ping Tan, Gang Zeng, Jingdong Wang, Sing Bing Kang, Long Quan: Image-based tree modeling. ACM Trans. Graph. 26(3): 87 (2007)
17	EE	Gang Zeng, Sylvain Paris, Long Quan, François X. Sillion: Accurate and Scalable Surface Representation and Reconstruction from Images. IEEE Trans. Pattern Anal. Mach. Intell. 29(1): 141-158 (2007)
16	EE	Gang Zeng, Hideo Ito: Low-Cost IP Core Test Using Tri-Template-Based Codes. IEICE Transactions 90-D(1): 288-295 (2007)
2006
15	EE	Gang Zeng, Hideo Ito: Concurrent core test for SOC using shared test set and scan chain disable. DATE 2006: 1045-1050
14	EE	Gang Zeng, Youhua Shi, Toshinori Takabatake, Masao Yanagisawa, Hideo Ito: Low-Cost IP Core Test Using Multiple-Mode Loading Scan Chain and Scan Chain Clusters. DFT 2006: 136-144
13	EE	Long Quan, Ping Tan, Gang Zeng, Lu Yuan, Jingdong Wang, Sing Bing Kang: Image-based plant modeling. ACM Trans. Graph. 25(3): 599-604 (2006)
12	EE	Gang Zeng, Hideo Ito: Concurrent Core Testing for SOC Using Merged Test Set and Scan Tree. IEICE Transactions 89-D(3): 1157-1164 (2006)
2005
11	EE	Gang Zeng, Yasuyuki Matsushita, Long Quan, Heung-Yeung Shum: Interactive Shape from Shading. CVPR (1) 2005: 343-350
10	EE	Gang Zeng, Hideo Ito: Concurrent Core Test for Test Cost Reduction Using Merged Test Set and Scan Tree. ICCD 2005: 143-146
9	EE	Gang Zeng, Sylvain Paris, Long Quan, François X. Sillion: Progressive Surface Reconstruction from Images Using a Local Prior. ICCV 2005: 1230-1237
8	EE	Gang Zeng, Hideo Ito: Hybrid Pattern BIST for Low-Cost Core Testing Using Embedded FPGA Core. IEICE Transactions 88-D(5): 984-992 (2005)
7	EE	Gang Zeng, Hideo Ito: X-Tolerant Test Data Compression for SOC with Enhanced Diagnosis Capability. IEICE Transactions 88-D(7): 1662-1670 (2005)
2004
6	EE	Gang Zeng, Hideo Ito: Non-Intrusive Test Compression for SOC Using Embedded FPGA Core. DFT 2004: 413-421
5	EE	Gang Zeng, Sylvain Paris, Long Quan, Maxime Lhuillier: Surface Reconstruction by Propagating 3D Stereo Data in Multiple 2D Images. ECCV (1) 2004: 163-174
4	EE	Gang Zeng, Sylvain Paris, Long Quan: Robust Carving for Non-Lambertian Objects. ICPR (3) 2004: 119-122
3	EE	Gang Zeng, Maxime Lhuillier, Long Quan: Recent Methods for Reconstructing Surfaces from Multiple Images. IWMM/GIAE 2004: 429-447
2	EE	Gang Zeng, Hideo Ito: Hybrid BIST for System-on-a-Chip Using an Embedded FPGA Core. VTS 2004: 355-360
2003
1	EE	Gang Zeng, Hideo Ito: Efficient Test Data Decompression for System-on-a-Chip Using an Embedded FPGA Core. DFT 2003: 503-510

Coauthor Index

1	Luc J. Van Gool	[19] [23]
2	Koji Inoue	[22]
3	Hideo Ito	[1] [2] [6] [7] [8] [10] [12] [14] [15] [16]
4	Sing Bing Kang	[13] [18]
5	Maxime Lhuillier	[3] [5]
6	Yasuyuki Matsushita	[11]
7	Pascal Müller	[19]
8	Sylvain Paris	[4] [5] [9] [17]
9	Long Quan	[3] [4] [5] [9] [11] [13] [17] [18]
10	Youhua Shi	[14]
11	Harry Shum (Heung-Yeung Shum)	[11]
12	François X. Sillion	[9] [17]
13	Toshinori Takabatake	[14]
14	Hiroaki Takada	[20] [21] [22]
15	Ping Tan	[13] [18]
16	Hiroyuki Tomiyama	[20] [21] [22]
17	Jingdong Wang	[13] [18]
18	Peter Wonka	[19]
19	Masao Yanagisawa	[14]
20	Lu Yuan	[13]
21	Junpei Zushi	[22]

Colors in the list of coauthors