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Abdelaziz Ammari

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2007
7EERégis Leveugle, Abdelaziz Ammari, V. Maingot, E. Teyssou, Pascal Moitrel, Christophe Mourtel, Nathalie Feyt, Jean-Baptiste Rigaud, Assia Tria: Experimental evaluation of protections against laser-induced faults and consequences on fault modeling. DATE 2007: 1587-1592
2006
6EEAbdelaziz Ammari, Régis Leveugle, B. Nicolescu, Yvon Savaria: Evaluation of a Software-Based Error Detection Technique by RT-Level Fault Injection. DELTA 2006: 488-493
2005
5EEAbdelaziz Ammari, K. Hadjiat, Régis Leveugle: Combined Fault Classification and Error Propagation Analysis to Refine RT-Level Dependability Evaluation. J. Electronic Testing 21(4): 365-376 (2005)
2004
4EERégis Leveugle, Abdelaziz Ammari: Early SEU Fault Injection in Digital, Analog and Mixed Signal Circuits: A Global Flow. DATE 2004: 590-595
3EERégis Leveugle, D. Cimonnet, Abdelaziz Ammari: System-Level Dependability Analysis with RT-Level Fault Injection Accuracy. DFT 2004: 451-458
2EEAbdelaziz Ammari, K. Hadjiat, Régis Leveugle: On Combining Fault Classification and Error Propagation Analysis in RT-Level Dependability Evaluation. IOLTS 2004: 227-232
2003
1EEAbdelaziz Ammari, Régis Leveugle, Matteo Sonza Reorda, Massimo Violante: Detailed Comparison of Dependability Analyses Performed at RT and Gate Levels. DFT 2003: 336-343

Coauthor Index

1D. Cimonnet [3]
2Nathalie Feyt [7]
3K. Hadjiat [2] [5]
4Régis Leveugle [1] [2] [3] [4] [5] [6] [7]
5V. Maingot [7]
6Pascal Moitrel [7]
7Christophe Mourtel [7]
8B. Nicolescu [6]
9Matteo Sonza Reorda [1]
10Jean-Baptiste Rigaud [7]
11Yvon Savaria [6]
12E. Teyssou [7]
13Assia Tria [7]
14Massimo Violante [1]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)