| 2007 |
|---|
| 9 | EE | Tejasvi Das,
P. R. Mukund:
Sensitivity analysis for fault-analysis and tolerance in RF front-end circuitry.
DATE 2007: 1277-1282 |
| 2006 |
|---|
| 8 | EE | Tejasvi Das,
Ponnathpur R. Mukund:
Self-calibration of gain and output match in LNAs.
ISCAS 2006 |
| 7 | EE | Tejasvi Das,
Anand Gopalan,
Clyde Washburn,
P. R. Mukund:
Towards Fault-Tolerant RF Front Ends.
J. Electronic Testing 22(4-6): 371-386 (2006) |
| 2005 |
|---|
| 6 | EE | Anand Gopalan,
Tejasvi Das,
Clyde Washburn,
Ponnathpur R. Mukund:
Use of source degeneration for non-intrusive BIST of RF front-end circuits.
ISCAS (5) 2005: 4385-4388 |
| 5 | EE | Tejasvi Das,
Clyde Washburn,
P. R. Mukund,
Steve Howard,
Ken Paradis,
Jung-Geau Jang,
Jan Kolnik,
Jeff Burleson:
Effects of Technology and Dimensional Scaling on Input Loss Prediction of RF MOSFETs.
VLSI Design 2005: 295-300 |
| 4 | EE | Anand Gopalan,
Tejasvi Das,
Clyde Washburn,
P. R. Mukund:
An Ultra-Fast, On-Chip BiST for RF Low Noise Amplifiers.
VLSI Design 2005: 485-490 |
| 2004 |
|---|
| 3 | EE | Tejasvi Das,
Anand Gopalan,
Clyde Washburn,
P. R. Mukund:
Dynamic Input Match Correction in RF Low Noise Amplifiers.
DFT 2004: 211-219 |
| 2 | EE | Ghanshyam Nayak,
Tejasvi Das,
T. M. Rao,
P. R. Mukund:
DREAM: A Chip-Package Co-Design Tool for RF-Mixed Signal Systems.
ISVLSI 2004: 207-210 |
| 1 | EE | Tejasvi Das,
P. R. Mukund:
A Low Noise Current-mode Readout circuit for CMOS Image Sensing Applications.
VLSI Design 2004: 635-638 |
