Baosheng Wang

2008
20	EE	Hong Wang, Zhenghu Gong, Qing Guan, Baosheng Wang: Detection Network Anomalies Based on Packet and Flow Analysis. ICN 2008: 497-502
19	EE	Wei Cheng, Kai Xing, Xiuzhen Cheng, Xicheng Lu, Zexin Lu, Jinshu Su, Baosheng Wang, Yujun Liu: Route recovery in vertex-disjoint multipath routing for many-to-one sensor networks. MobiHoc 2008: 209-220
2007
18	EE	Feng Zhao, Xicheng Lu, Baosheng Wang, Peidong Zhu: Evaluating Internal BGP Networks from the Data Plane. Networking 2007: 1192-1195
17	EE	Feng Zhao, Peidong Zhu, Meng Wang, Baosheng Wang: Optimizing Network Configurations Based on Potential Profit Loss. SNPD (1) 2007: 327-332
16	EE	Baosheng Wang, Yuejian Wu, André Ivanov: A Fast Diagnosis Scheme for Distributed Small Embedded SRAMs CoRR abs/0710.4655: (2007)
2006
15	EE	Qiang Xu, Baosheng Wang, F. Y. Young: Retention-Aware Test Scheduling for BISTed Embedded SRAMs. European Test Symposium 2006: 83-88
14	EE	Yaping Liu, Zhenghu Gong, Baosheng Wang, Jinshu Shu: A Routing Optimization Algorithm for BGP Egress Selection. ICDCIT 2006: 192-199
13	EE	Dongsheng Li, Xicheng Lu, Baosheng Wang, Jinshu Su, Jiannong Cao, Keith C. C. Chan, Hong Va Leong: Delay-Bounded Range Queries in DHT-based Peer-to-Peer Systems. ICDCS 2006: 64
12	EE	Josh Yang, Baosheng Wang, Yuejian Wu, André Ivanov: Fast detection of data retention faults and other SRAM cell open defects. IEEE Trans. on CAD of Integrated Circuits and Systems 25(1): 167-180 (2006)
2005
11	EE	Baosheng Wang, Josh Yang, Yuejian Wu, André Ivanov: A retention-aware test power model for embedded SRAM. ASP-DAC 2005: 1180-1183
10	EE	Baosheng Wang, Yuejian Wu, André Ivanov: A Fast Diagnosis Scheme for Distributed Small Embedded SRAMs. DATE 2005: 852-857
9	EE	Cristian Grecu, Partha Pratim Pande, Baosheng Wang, André Ivanov, Res Saleh: Methodologies and Algorithms for Testing Switch-Based NoC Interconnects. DFT 2005: 238-246
8	EE	Baosheng Wang, Xicheng Lu: Design and Implementation of Control-Extensible Router. ICCNMC 2005: 762-771
7	EE	Baosheng Wang, Yuejian Wu, Josh Yang, André Ivanov, Yervant Zorian: SRAM Retention Testing: Zero Incremental Time Integration with March Algorithms. VTS 2005: 66-71
6	EE	Baosheng Wang, Andy Kuo, Touraj Farahmand, André Ivanov, Yong B. Cho, Sassan Tabatabaei: A Realistic Timing Test Model and Its Applications in High-Speed Interconnect Devices. J. Electronic Testing 21(6): 621-630 (2005)
2004
5	EE	Baosheng Wang, Yuejian Wu, André Ivanov: Designs for Reducing Test Time of Distributed Small Embedded SRAMs. DFT 2004: 120-128
4	EE	Josh Yang, Baosheng Wang, André Ivanov: Open Defects Detection within 6T SRAM Cells using a No Write Recovery Test Mode. VLSI Design 2004: 493-498
3	EE	Baosheng Wang, Josh Yang, James Cicalo, André Ivanov, Yervant Zorian: Reducing Embedded SRAM Test Time under Redundancy Constraints. VTS 2004: 237-242
2003
2	EE	Baosheng Wang, Yong B. Cho, Sassan Tabatabaei, André Ivanov: Yield, Overall Test Environment Timing Accuracy, and Defect Level Trade-Offs for High-Speed Interconnect Device Testing. Asian Test Symposium 2003: 348-353
1	EE	Baosheng Wang, Josh Yang, André Ivanov: Reducing Test Time of Embedded SRAMs. MTDT 2003: 47-52

Coauthor Index

1	Jiannong Cao	[13]
2	Keith C. C. Chan	[13]
3	Wei Cheng	[19]
4	Xiuzhen Cheng	[19]
5	Yong B. Cho	[2] [6]
6	James Cicalo	[3]
7	Touraj Farahmand	[6]
8	Zhenghu Gong	[14] [20]
9	Cristian Grecu	[9]
10	Qing Guan	[20]
11	André Ivanov	[1] [2] [3] [4] [5] [6] [7] [9] [10] [11] [12] [16]
12	Andy Kuo	[6]
13	Hong Va Leong	[13]
14	Dongsheng Li	[13]
15	Yaping Liu	[14]
16	Yujun Liu	[19]
17	Xicheng Lu	[8] [13] [18] [19]
18	Zexin Lu	[19]
19	Partha Pratim Pande	[9]
20	Resve A. Saleh (Resve Saleh, Res Saleh)	[9]
21	Jinshu Shu	[14]
22	Jinshu Su	[13] [19]
23	Sassan Tabatabaei	[2] [6]
24	Hong Wang	[20]
25	Meng Wang	[17]
26	Yuejian Wu	[5] [7] [10] [11] [12] [16]
27	Kai Xing	[19]
28	Qiang Xu	[15]
29	Josh Yang	[1] [3] [4] [7] [11] [12]
30	Evangeline F. Y. Young (F. Y. Young, Fung Yu Young)	[15]
31	Feng Zhao	[17] [18]
32	Peidong Zhu	[17] [18]
33	Yervant Zorian	[3] [7]

Colors in the list of coauthors