Anis Nazer
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2004
1
EE
Najwa Aaraj
, Anis Nazer,
Ali Chehab
,
Ayman I. Kayssi
: Transient Current Testing of Dynamic CMOS Circuits.
DFT 2004
: 264-271
Coauthor
Index
1
Najwa Aaraj
[
1
]
2
Ali Chehab
[
1
]
3
Ayman I. Kayssi
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
