| 2002 |
|---|
| 8 | EE | Pranab K. Nag,
Anne E. Gattiker,
Sichao Wei,
Ronald D. Blanton,
Wojciech Maly:
Modeling the Economics of Testing: A DFT Perspective.
IEEE Design & Test of Computers 19(1): 29-41 (2002) |
| 2000 |
|---|
| 7 | EE | Peng Li,
Pranab K. Nag,
Wojciech Maly:
Cost based tradeoff analysis of standard cell designs.
SLIP 2000: 129-135 |
| 1998 |
|---|
| 6 | EE | Wojciech Maly,
Pranab K. Nag,
Hans T. Heineken,
Jitendra Khare:
Design-Manufacturing Interface: Part I - Vision.
DATE 1998: 550-556 |
| 5 | EE | Wojciech Maly,
Pranab K. Nag,
Charles H. Ouyang,
Hans T. Heineken,
Jitendra Khare,
P. Simon:
Design-Manufacturing Interface: Part II - Applications.
DATE 1998: 557-562 |
| 1997 |
|---|
| 4 | EE | Hans T. Heineken,
Jitendra Khare,
Wojciech Maly,
Pranab K. Nag,
Charles H. Ouyang,
Witold A. Pleskacz:
CAD at the Design-Manufacturing Interface.
DAC 1997: 321-326 |
| 3 | | Sichao Wei,
Pranab K. Nag,
Ronald D. Blanton,
Anne E. Gattiker,
Wojciech Maly:
To DFT or Not to DFT?
ITC 1997: 557-566 |
| 1996 |
|---|
| 2 | EE | Wojciech Maly,
Hans T. Heineken,
Jitendra Khare,
Pranab K. Nag:
Design for manufacturability in submicron domain.
ICCAD 1996: 690-697 |
| 1995 |
|---|
| 1 | EE | Jitendra Khare,
Sujoy Mitra,
Pranab K. Nag,
U. Maly,
Rob A. Rutenbar:
Testability-oriented channel routing.
VLSI Design 1995: 208-213 |
