| 2007 |
|---|
| 7 | EE | Chris Schuermyer,
Jewel Pangilinan,
Jay Jahangiri,
Martin Keim,
Janusz Rajski,
Brady Benware:
Silicon Evaluation of Static Alternative Fault Models.
VTS 2007: 265-270 |
| 2006 |
|---|
| 6 | EE | Jeffrey E. Nelson,
Thomas Zanon,
Jason G. Brown,
Osei Poku,
R. D. (Shawn) Blanton,
Wojciech Maly,
Brady Benware,
Chris Schuermyer:
Extracting Defect Density and Size Distributions from Product ICs.
IEEE Design & Test of Computers 23(5): 390-400 (2006) |
| 2004 |
|---|
| 5 | EE | Robert Madge,
Brady Benware,
Ritesh P. Turakhia,
W. Robert Daasch,
Chris Schuermyer,
Jens Ruffler:
In Search of the Optimum Test Set - Adaptive Test Methods for Maximum Defect Coverage and Lowest Test Cost.
ITC 2004: 203-212 |
| 4 | EE | Chris Schuermyer,
Jens Ruffler,
W. Robert Daasch:
Minimum Testing Requirements to Screen Temperature Dependent Defects.
ITC 2004: 300-308 |
| 2003 |
|---|
| 3 | EE | Brady Benware,
Chris Schuermyer,
Sreenevasan Ranganathan,
Robert Madge,
Prabhu Krishnamurthy,
Nagesh Tamarapalli,
Kun-Han Tsai,
Janusz Rajski:
Impact of Multiple-Detect Test Patterns on Product Quality.
ITC 2003: 1031-1040 |
| 2 | EE | Chris Schuermyer,
Brady Benware,
Kevin Cota,
Robert Madge,
W. Robert Daasch,
L. Ning:
Screening VDSM Outliers using Nominal and Subthreshold Supply Voltage IDDQ.
ITC 2003: 565-573 |
| 2002 |
|---|
| 1 | EE | Robert Madge,
B. H. Goh,
V. Rajagopalan,
C. Macchietto,
W. Robert Daasch,
Chris Schuermyer,
C. Taylor,
David Turner:
Screening MinVDD Outliers Using Feed-Forward Voltage Testing.
ITC 2002: 673-682 |
