Thomas J. Vogels

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6EEThomas J. Vogels, Thomas Zanon, Rao Desineni, R. D. (Shawn) Blanton, Wojciech Maly, Jason G. Brown, Jeffrey E. Nelson, Y. Fei, X. Huang, Padmini Gopalakrishnan, Mahim Mishra, V. Rovner, S. Tiwary: Benchmarking Diagnosis Algorithms With a Diverse Set of IC Deformations. ITC 2004: 508-517
5EEThomas J. Vogels, Wojciech Maly, R. D. (Shawn) Blanton: Progressive Bridge Identification. ITC 2003: 309-318
4EEWojciech Maly, Anne E. Gattiker, Thomas Zanon, Thomas J. Vogels, R. D. (Shawn) Blanton, Thomas M. Storey: Deformations of IC Structure in Test and Yield Learning. ITC 2003: 856-865
3EEThomas J. Vogels: Effectiveness of I-V Testing in Comparison to IDDq Tests. VTS 2003: 47-56
2EERonald D. Blanton, John T. Chen, Rao Desineni, Kumar N. Dwarakanath, Wojciech Maly, Thomas J. Vogels: Fault Tuples in Diagnosis of Deep-Submicron Circuits. ITC 2002: 233-241
1EEWalter M. Lindermeir, Thomas J. Vogels, Helmut E. Graeb: Analog Test Design with IDD Measurements for the Detection of Parametric and Catastrophic Faults. DATE 1998: 822-

Coauthor Index

1R. D. (Shawn) Blanton (Ronald D. Blanton) [2] [4] [5] [6]
2Jason G. Brown [6]
3John T. Chen [2]
4Rao Desineni [2] [6]
5Kumar N. Dwarakanath [2]
6Y. Fei [6]
7Anne E. Gattiker [4]
8Padmini Gopalakrishnan [6]
9Helmut E. Graeb [1]
10X. Huang [6]
11Walter M. Lindermeir [1]
12Wojciech Maly [2] [4] [5] [6]
13Mahim Mishra [6]
14Jeffrey E. Nelson [6]
15V. Rovner [6]
16Thomas M. Storey [4]
17S. Tiwary [6]
18Thomas Zanon [4] [6]

Colors in the list of coauthors

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)