| 2004 |
|---|
| 6 | EE | Thomas J. Vogels,
Thomas Zanon,
Rao Desineni,
R. D. (Shawn) Blanton,
Wojciech Maly,
Jason G. Brown,
Jeffrey E. Nelson,
Y. Fei,
X. Huang,
Padmini Gopalakrishnan,
Mahim Mishra,
V. Rovner,
S. Tiwary:
Benchmarking Diagnosis Algorithms With a Diverse Set of IC Deformations.
ITC 2004: 508-517 |
| 2003 |
|---|
| 5 | EE | Thomas J. Vogels,
Wojciech Maly,
R. D. (Shawn) Blanton:
Progressive Bridge Identification.
ITC 2003: 309-318 |
| 4 | EE | Wojciech Maly,
Anne E. Gattiker,
Thomas Zanon,
Thomas J. Vogels,
R. D. (Shawn) Blanton,
Thomas M. Storey:
Deformations of IC Structure in Test and Yield Learning.
ITC 2003: 856-865 |
| 3 | EE | Thomas J. Vogels:
Effectiveness of I-V Testing in Comparison to IDDq Tests.
VTS 2003: 47-56 |
| 2002 |
|---|
| 2 | EE | Ronald D. Blanton,
John T. Chen,
Rao Desineni,
Kumar N. Dwarakanath,
Wojciech Maly,
Thomas J. Vogels:
Fault Tuples in Diagnosis of Deep-Submicron Circuits.
ITC 2002: 233-241 |
| 1998 |
|---|
| 1 | EE | Walter M. Lindermeir,
Thomas J. Vogels,
Helmut E. Graeb:
Analog Test Design with IDD Measurements for the Detection of Parametric and Catastrophic Faults.
DATE 1998: 822- |
