| |
| 2006 | ||
|---|---|---|
| 1 | EE | Jeffrey E. Nelson, Thomas Zanon, Rao Desineni, Jason G. Brown, N. Patil, Wojciech Maly, R. D. (Shawn) Blanton: Extraction of defect density and size distributions from wafer sort test results. DATE 2006: 913-918 |
| 1 | R. D. (Shawn) Blanton (Ronald D. Blanton) | [1] |
| 2 | Jason G. Brown | [1] |
| 3 | Rao Desineni | [1] |
| 4 | Wojciech Maly | [1] |
| 5 | Jeffrey E. Nelson | [1] |
| 6 | Thomas Zanon | [1] |