| 2006 |
|---|
| 7 | EE | Jeffrey E. Nelson,
Jason G. Brown,
Rao Desineni,
R. D. (Shawn) Blanton:
Multiple-detect ATPG based on physical neighborhoods.
DAC 2006: 1099-1102 |
| 6 | EE | Jeffrey E. Nelson,
Thomas Zanon,
Rao Desineni,
Jason G. Brown,
N. Patil,
Wojciech Maly,
R. D. (Shawn) Blanton:
Extraction of defect density and size distributions from wafer sort test results.
DATE 2006: 913-918 |
| 5 | EE | Ronald D. Blanton,
Kumar N. Dwarakanath,
Rao Desineni:
Defect Modeling Using Fault Tuples.
IEEE Trans. on CAD of Integrated Circuits and Systems 25(11): 2450-2464 (2006) |
| 2005 |
|---|
| 4 | EE | Rao Desineni,
R. D. (Shawn) Blanton:
Diagnosis of Arbitrary Defects Using Neighborhood Function Extraction.
VTS 2005: 366-373 |
| 2004 |
|---|
| 3 | EE | Thomas J. Vogels,
Thomas Zanon,
Rao Desineni,
R. D. (Shawn) Blanton,
Wojciech Maly,
Jason G. Brown,
Jeffrey E. Nelson,
Y. Fei,
X. Huang,
Padmini Gopalakrishnan,
Mahim Mishra,
V. Rovner,
S. Tiwary:
Benchmarking Diagnosis Algorithms With a Diverse Set of IC Deformations.
ITC 2004: 508-517 |
| 2002 |
|---|
| 2 | EE | Ronald D. Blanton,
John T. Chen,
Rao Desineni,
Kumar N. Dwarakanath,
Wojciech Maly,
Thomas J. Vogels:
Fault Tuples in Diagnosis of Deep-Submicron Circuits.
ITC 2002: 233-241 |
| 2000 |
|---|
| 1 | | Rao Desineni,
Kumar N. Dwarakanath,
Ronald D. Blanton:
Universal test generation using fault tuples.
ITC 2000: 812-819 |
