| 2006 |
|---|
| 4 | EE | Jeffrey E. Nelson,
Thomas Zanon,
Rao Desineni,
Jason G. Brown,
N. Patil,
Wojciech Maly,
R. D. (Shawn) Blanton:
Extraction of defect density and size distributions from wafer sort test results.
DATE 2006: 913-918 |
| 3 | EE | Jeffrey E. Nelson,
Thomas Zanon,
Jason G. Brown,
Osei Poku,
R. D. (Shawn) Blanton,
Wojciech Maly,
Brady Benware,
Chris Schuermyer:
Extracting Defect Density and Size Distributions from Product ICs.
IEEE Design & Test of Computers 23(5): 390-400 (2006) |
| 2004 |
|---|
| 2 | EE | Thomas J. Vogels,
Thomas Zanon,
Rao Desineni,
R. D. (Shawn) Blanton,
Wojciech Maly,
Jason G. Brown,
Jeffrey E. Nelson,
Y. Fei,
X. Huang,
Padmini Gopalakrishnan,
Mahim Mishra,
V. Rovner,
S. Tiwary:
Benchmarking Diagnosis Algorithms With a Diverse Set of IC Deformations.
ITC 2004: 508-517 |
| 2003 |
|---|
| 1 | EE | Wojciech Maly,
Anne E. Gattiker,
Thomas Zanon,
Thomas J. Vogels,
R. D. (Shawn) Blanton,
Thomas M. Storey:
Deformations of IC Structure in Test and Yield Learning.
ITC 2003: 856-865 |
