| 2008 |
|---|
| 3 | EE | Wing Chiu Tam,
Osei Poku,
R. D. (Shawn) Blanton:
Precise failure localization using automated layout analysis of diagnosis candidates.
DAC 2008: 367-372 |
| 2 | EE | Yen-Tzu Lin,
Osei Poku,
Naresh K. Bhatti,
Ronald D. Blanton:
Physically-Aware N-Detect Test Pattern Selection.
DATE 2008: 634-639 |
| 2006 |
|---|
| 1 | EE | Jeffrey E. Nelson,
Thomas Zanon,
Jason G. Brown,
Osei Poku,
R. D. (Shawn) Blanton,
Wojciech Maly,
Brady Benware,
Chris Schuermyer:
Extracting Defect Density and Size Distributions from Product ICs.
IEEE Design & Test of Computers 23(5): 390-400 (2006) |
