John T. Chen

2002
3	EE	Ronald D. Blanton, John T. Chen, Rao Desineni, Kumar N. Dwarakanath, Wojciech Maly, Thomas J. Vogels: Fault Tuples in Diagnosis of Deep-Submicron Circuits. ITC 2002: 233-241
2001
2		John T. Chen, Jitendra Khare, Ken Walker, Saghir A. Shaikh, Janusz Rajski, Wojciech Maly: Test response compression and bitmap encoding for embedded memories in manufacturing process monitoring. ITC 2001: 258-267
1	EE	John T. Chen, Wojciech Maly, Janusz Rajski, Omar Kebichi, Jitendra Khare: Enabling Embedded Memory Diagnosis via Test Response Compression. VTS 2001: 292-298

Coauthor Index

1	R. D. (Shawn) Blanton (Ronald D. Blanton)	[3]
2	Rao Desineni	[3]
3	Kumar N. Dwarakanath	[3]
4	Omar Kebichi	[1]
5	Jitendra Khare	[1] [2]
6	Wojciech Maly	[1] [2] [3]
7	Janusz Rajski	[1] [2]
8	Saghir A. Shaikh	[2]
9	Thomas J. Vogels	[3]
10	Ken Walker	[2]