| |
| 2001 | ||
|---|---|---|
| 1 | EE | Davide Appello, Fulvio Corno, M. Giovinetto, Maurizio Rebaudengo, Matteo Sonza Reorda: A P1500 Compliant BIST-Based Approach to Embedded RAM Diagnosis. Asian Test Symposium 2001: 97-102 |
| 1 | Davide Appello | [1] |
| 2 | Fulvio Corno | [1] |
| 3 | Maurizio Rebaudengo | [1] |
| 4 | Matteo Sonza Reorda | [1] |