| |
| 1998 | ||
|---|---|---|
| 1 | EE | Elizabeth M. Rudnick, Roberto Vietti, Akilah Ellis, Fulvio Corno, Paolo Prinetto, Matteo Sonza Reorda: Fast Sequential Circuit Test Generation Using High-Level and Gate-Level Techniques. DATE 1998: 570-576 |
| 1 | Fulvio Corno | [1] |
| 2 | Paolo Prinetto | [1] |
| 3 | Matteo Sonza Reorda | [1] |
| 4 | Elizabeth M. Rudnick | [1] |
| 5 | Roberto Vietti | [1] |