| 2003 |
|---|
| 6 | EE | Fulvio Corno,
Gianluca Cumani,
Matteo Sonza Reorda,
Giovanni Squillero:
Fully Automatic Test Program Generation for Microprocessor Cores.
DATE 2003: 11006-11011 |
| 5 | | Fulvio Corno,
Gianluca Cumani,
Matteo Sonza Reorda,
Giovanni Squillero:
Automatic Test Program Generation for Pipeline Processors.
SAC 2003: 736-740 |
| 2002 |
|---|
| 4 | EE | Fulvio Corno,
Gianluca Cumani,
Matteo Sonza Reorda,
Giovanni Squillero:
Evolutionary Test Program Induction for Microprocessor Design Verification.
Asian Test Symposium 2002: 368-373 |
| 3 | EE | Fulvio Corno,
Gianluca Cumani,
Matteo Sonza Reorda,
Giovanni Squillero:
Automatic Test Program Generation from RT-Level Microprocessor Descriptions.
ISQED 2002: 120- |
| 2001 |
|---|
| 2 | EE | Fulvio Corno,
Gianluca Cumani,
Matteo Sonza Reorda,
Giovanni Squillero:
Effective Techniques for High-Level ATPG.
Asian Test Symposium 2001: 225- |
| 1 | EE | Fulvio Corno,
Gianluca Cumani,
Matteo Sonza Reorda,
Giovanni Squillero:
ARPIA: A High-Level Evolutionary Test Signal Generator.
EvoWorkshops 2001: 298-306 |
