Roberto Vietti

1998
2	EE	Elizabeth M. Rudnick, Roberto Vietti, Akilah Ellis, Fulvio Corno, Paolo Prinetto, Matteo Sonza Reorda: Fast Sequential Circuit Test Generation Using High-Level and Gate-Level Techniques. DATE 1998: 570-576
1	EE	Silvia Chiusano, Fulvio Corno, Matteo Sonza Reorda, Roberto Vietti: A System for Evaluating On-Line Testability at the RT-level. DFT 1998: 284-291

Coauthor Index

1	Silvia Chiusano	[1]
2	Fulvio Corno	[1] [2]
3	Akilah Ellis	[2]
4	Paolo Prinetto	[2]
5	Matteo Sonza Reorda	[1] [2]
6	Elizabeth M. Rudnick	[2]