| |
| 2005 | ||
|---|---|---|
| 6 | EE | Fernanda Irrera, Giuseppina Puzzilli, Domenico Caputo: A comprehensive model for oxide degradation. Microelectronics Reliability 45(5-6): 853-856 (2005) |
| 5 | EE | Fernanda Irrera, Giuseppina Puzzilli: Crested barrier in the tunnel stack of non-volatile memories. Microelectronics Reliability 45(5-6): 907-910 (2005) |
| 2004 | ||
| 4 | EE | Domenico Caputo, Fernanda Irrera: On the reliability of ZrO2 films for VLSI applications. Microelectronics Reliability 44(5): 739-745 (2004) |
| 2002 | ||
| 3 | EE | Domenico Caputo, Fernanda Irrera: Investigation and modeling of stressed thermal oxides. Microelectronics Reliability 42(3): 327-333 (2002) |
| 2 | EE | Ruggero Feruglio, Fernanda Irrera, Bruno Riccò: Microscopic aspects of defect generation in SiO2. Microelectronics Reliability 42(9-11): 1427-1432 (2002) |
| 2001 | ||
| 1 | EE | Fernanda Irrera: Electrical degradation and recovery of dielectrics in n++-poly-Si/SiOx/SiO2/p-sub structures designed for application in low-voltage non-volatile memories. Microelectronics Reliability 41(11): 1809-1813 (2001) |
| 1 | Domenico Caputo | [3] [4] [6] |
| 2 | Ruggero Feruglio | [2] |
| 3 | Giuseppina Puzzilli | [5] [6] |
| 4 | Bruno Riccò | [2] |