| 2009 |
|---|
| 22 | EE | Michele Favalli,
Marcello Dalpasso:
How Many Test Vectors We Need to Detect a Bridging Fault?
J. Electronic Testing 25(1): 79-95 (2009) |
| 2007 |
|---|
| 21 | EE | Michele Favalli,
Marcello Dalpasso:
High Quality Test Vectors for Bridging Faults in the Presence of IC's Parameters Variations.
DFT 2007: 448-456 |
| 2005 |
|---|
| 20 | EE | Marcello Dalpasso,
Giuseppe Lancia,
Romeo Rizzi:
The String Barcoding Problem is NP-Hard.
Comparative Genomics 2005: 88-96 |
| 2002 |
|---|
| 19 | EE | Michele Favalli,
Marcello Dalpasso:
An Evolutionary Approach to the Design of On-Chip Pseudorandom Test Pattern Generators.
DATE 2002: 1122 |
| 18 | EE | Marcello Dalpasso,
Alessandro Bogliolo,
Luca Benini:
Virtual Simulation of Distributed IP-Based Designs.
IEEE Design & Test of Computers 19(5): 92-104 (2002) |
| 17 | EE | Michele Favalli,
Marcello Dalpasso:
Bridging fault modeling and simulation for deep submicron CMOS ICs.
IEEE Trans. on CAD of Integrated Circuits and Systems 21(8): 941-953 (2002) |
| 2000 |
|---|
| 16 | EE | Marcello Dalpasso,
Alessandro Bogliolo,
Luca Benini:
Hardware/software IP protection.
DAC 2000: 593-596 |
| 15 | EE | Marcello Dalpasso,
Alessandro Bogliolo,
Luca Benini,
Michele Favalli:
Virtual Fault Simulation of Distributed IP-Based Designs.
DATE 2000: 99- |
| 1999 |
|---|
| 14 | EE | Marcello Dalpasso,
Alessandro Bogliolo,
Luca Benini:
Virtual Simulation of Distributed IP-based Designs.
DAC 1999: 50-55 |
| 13 | EE | Marcello Dalpasso,
Alessandro Bogliolo,
Luca Benini:
Specification and Validation of Distributed IP-Based Designs with JavaCAD.
DATE 1999: 684-688 |
| 1998 |
|---|
| 12 | EE | Piero Olivo,
Marcello Dalpasso:
A Bist Scheme for Non-Volatile Memories.
J. Electronic Testing 12(1-2): 139-144 (1998) |
| 1997 |
|---|
| 11 | EE | Marcello Dalpasso,
Michele Favalli:
A method for increasing the IDDQ testability.
IEEE Trans. on CAD of Integrated Circuits and Systems 16(10): 1186-1188 (1997) |
| 10 | EE | Michele Favalli,
Marcello Dalpasso:
Symbolic Handling of Bridging Fault Effects.
J. Electronic Testing 10(3): 271-276 (1997) |
| 1996 |
|---|
| 9 | | Piero Olivo,
Marcello Dalpasso:
Self-Learning Signature Analysis for Non-Volatile Memory Testing.
ITC 1996: 303-308 |
| 8 | EE | Michele Favalli,
Marcello Dalpasso,
Piero Olivo:
Modeling and simulation of broken connections in CMOS IC's.
IEEE Trans. on CAD of Integrated Circuits and Systems 15(7): 808-814 (1996) |
| 1995 |
|---|
| 7 | EE | Marcello Dalpasso,
Michele Favalli,
Piero Olivo:
Test pattern generation for I/sub DDQ/: increasing test quality.
VTS 1995: 304-309 |
| 1994 |
|---|
| 6 | | Michele Favalli,
Marcello Dalpasso,
Piero Olivo,
Bruno Riccò:
Modeling of Broken Connections Faults in CMOS ICs.
EDAC-ETC-EUROASIC 1994: 159-164 |
| 1993 |
|---|
| 5 | | Michele Favalli,
Marcello Dalpasso,
Piero Olivo,
Bruno Riccò:
Analyss of Dynamic Effects of Resistive Bridging Faults in CMOS and BiCMOS Digital ICs.
ITC 1993: 865-874 |
| 4 | EE | Michele Favalli,
Marcello Dalpasso,
Piero Olivo,
Bruno Riccò:
Analysis of resistive bridging fault detection in BiCMOS digital ICs.
IEEE Trans. VLSI Syst. 1(3): 342-355 (1993) |
| 3 | EE | Marcello Dalpasso,
Michele Favalli,
Piero Olivo,
Bruno Riccò:
Fault simulation of parametric bridging faults in CMOS IC's.
IEEE Trans. on CAD of Integrated Circuits and Systems 12(9): 1403-1410 (1993) |
| 1992 |
|---|
| 2 | | Michele Favalli,
Marcello Dalpasso,
Piero Olivo,
Bruno Riccò:
Analysis of Steady State Detection of Resistive Bridging Faults in BiCMOS Digital ICs.
ITC 1992: 466-475 |
| 1 | | Marcello Dalpasso,
Michele Favalli,
Piero Olivo,
Bruno Riccò:
Parametric Bridging Fault Characterization for the Fault Simulation of Library-Based ICs.
ITC 1992: 486-495 |
