Ruggero Feruglio
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2002
1
EE
Ruggero Feruglio,
Fernanda Irrera
,
Bruno Riccò
: Microscopic aspects of defect generation in SiO
2
.
Microelectronics Reliability 42
(9-11): 1427-1432 (2002)
Coauthor
Index
1
Fernanda Irrera
[
1
]
2
Bruno Riccò
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
