Piero Olivo

2005
29	EE	Andrea Chimenton, Piero Olivo: Reliability of erasing operation in NOR-Flash memories. Microelectronics Reliability 45(7-8): 1094-1108 (2005)
1998
28	EE	Piero Olivo, Marcello Dalpasso: A Bist Scheme for Non-Volatile Memories. J. Electronic Testing 12(1-2): 139-144 (1998)
1997
27	EE	Cecilia Metra, Michele Favalli, Piero Olivo, Bruno Riccò: On-line detection of bridging and delay faults in functional blocks of CMOS self-checking circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 16(7): 770-776 (1997)
1996
26		Piero Olivo, Marcello Dalpasso: Self-Learning Signature Analysis for Non-Volatile Memory Testing. ITC 1996: 303-308
25	EE	Michele Favalli, Marcello Dalpasso, Piero Olivo: Modeling and simulation of broken connections in CMOS IC's. IEEE Trans. on CAD of Integrated Circuits and Systems 15(7): 808-814 (1996)
1995
24	EE	Alessandro Bogliolo, Maurizio Damiani, Piero Olivo, Bruno Riccò: Reliability evaluation of combinational logic circuits by symbolic simulation. VTS 1995: 235-243
23	EE	Marcello Dalpasso, Michele Favalli, Piero Olivo: Test pattern generation for I/sub DDQ/: increasing test quality. VTS 1995: 304-309
22	EE	Cecilia Metra, Michele Favalli, Piero Olivo, Bruno Riccò: Design of CMOS checkers with improved testability of bridging and transistor stuck-on faults. J. Electronic Testing 6(1): 7-22 (1995)
1994
21		Michele Favalli, Marcello Dalpasso, Piero Olivo, Bruno Riccò: Modeling of Broken Connections Faults in CMOS ICs. EDAC-ETC-EUROASIC 1994: 159-164
1993
20		Cecilia Metra, Michele Favalli, Piero Olivo, Bruno Riccò: Design Rules for CMOS Self Checking Circuits with Parametric Faults in the Functional Block. DFT 1993: 271-278
19		Cecilia Metra, Michele Favalli, Piero Olivo, Bruno Riccò: A Highly Testable 1-out-of-3 CMOS Checker. DFT 1993: 279-286
18		Michele Favalli, Marcello Dalpasso, Piero Olivo, Bruno Riccò: Analyss of Dynamic Effects of Resistive Bridging Faults in CMOS and BiCMOS Digital ICs. ITC 1993: 865-874
17	EE	Michele Favalli, Marcello Dalpasso, Piero Olivo, Bruno Riccò: Analysis of resistive bridging fault detection in BiCMOS digital ICs. IEEE Trans. VLSI Syst. 1(3): 342-355 (1993)
16	EE	Marcello Dalpasso, Michele Favalli, Piero Olivo, Bruno Riccò: Fault simulation of parametric bridging faults in CMOS IC's. IEEE Trans. on CAD of Integrated Circuits and Systems 12(9): 1403-1410 (1993)
1992
15		Michele Favalli, Marcello Dalpasso, Piero Olivo, Bruno Riccò: Analysis of Steady State Detection of Resistive Bridging Faults in BiCMOS Digital ICs. ITC 1992: 466-475
14		Marcello Dalpasso, Michele Favalli, Piero Olivo, Bruno Riccò: Parametric Bridging Fault Characterization for the Fault Simulation of Library-Based ICs. ITC 1992: 486-495
13		Cecilia Metra, Michele Favalli, Piero Olivo, Bruno Riccò: CMOS Checkers with Testable Bridging and Transistor Stuck-on Faults. ITC 1992: 948-957
12	EE	Michele Favalli, Piero Olivo, Bruno Riccò: A probabilistic fault model for `analog' faults in digital CMOS circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 11(11): 1459-1462 (1992)
11	EE	Silvia Ercolani, Michele Favalli, Maurizio Damiani, Piero Olivo, Bruno Riccò: Testability measures in pseudorandom testing. IEEE Trans. on CAD of Integrated Circuits and Systems 11(6): 794-800 (1992)
10	EE	Michele Favalli, Piero Olivo, Bruno Riccò: Dynamic effects in the detection of bridging faults in CMOS ICs. J. Electronic Testing 3(3): 197-205 (1992)
1991
9		Maurizio Damiani, Piero Olivo, Bruno Riccò: Analysis and Design of Linear Finite State Machines for Signature Analysis Testing. IEEE Trans. Computers 40(9): 1034-1045 (1991)
8	EE	Michele Favalli, Piero Olivo, Bruno Riccò: A novel critical path heuristic for fast fault grading. IEEE Trans. on CAD of Integrated Circuits and Systems 10(4): 544-548 (1991)
7	EE	Michele Favalli, Piero Olivo, Maurizio Damiani, Bruno Riccò: Fault simulation of unconventional faults in CMOS circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 10(5): 677-682 (1991)
6	EE	Michele Favalli, Piero Olivo, Bruno Riccò, Fabio Somenzi: Fault simulation for general FCMOS ICs. J. Electronic Testing 2(2): 181-190 (1991)
1990
5	EE	Maurizio Damiani, Piero Olivo, Michele Favalli, Silvia Ercolani, Bruno Riccò: Aliasing in signature analysis testing with multiple input shift registers. IEEE Trans. on CAD of Integrated Circuits and Systems 9(12): 1344-1353 (1990)
1989
4		Mattia Lanzoni, Piero Olivo, Bruno Riccò: A Testing Technique to Characterize E^2PROM's Aging and Endurance. ITC 1989: 391-396
3		Michele Favalli, Piero Olivo, Maurizio Damiani, Bruno Riccò: CMOS Design for Improved IC Testability. ITC 1989: 934
2		Piero Olivo, Maurizio Damiani, Bruno Riccò: On the Design of Multiple-Input Shift-Registers for Signature Analysis Testing. ITC 1989: 936
1	EE	Maurizio Damiani, Piero Olivo, Michele Favalli, Bruno Riccò: An analytical model for the aliasing probability in signature analysis testing. IEEE Trans. on CAD of Integrated Circuits and Systems 8(11): 1133-1144 (1989)

Coauthor Index

1	Alessandro Bogliolo	[24]
2	Andrea Chimenton	[29]
3	Marcello Dalpasso	[14] [15] [16] [17] [18] [21] [23] [25] [26] [28]
4	Maurizio Damiani	[1] [2] [3] [5] [7] [9] [11] [24]
5	Silvia Ercolani	[5] [11]
6	Michele Favalli	[1] [3] [5] [6] [7] [8] [10] [11] [12] [13] [14] [15] [16] [17] [18] [19] [20] [21] [22] [23] [25] [27]
7	Mattia Lanzoni	[4]
8	Cecilia Metra	[13] [19] [20] [22] [27]
9	Bruno Riccò	[1] [2] [3] [4] [5] [6] [7] [8] [9] [10] [11] [12] [13] [14] [15] [16] [17] [18] [19] [20] [21] [22] [24] [27]
10	Fabio Somenzi	[6]

Colors in the list of coauthors