| 2003 |
|---|
| 8 | EE | Daniela De Venuto,
Michael J. Ohletz,
Bruno Riccò:
Automatic Repositioning Technique for Digital Cell Based Window Comparators and Implementation within Mixed-Signal DfT Schemes.
ISQED 2003: 431-437 |
| 7 | EE | Daniela De Venuto,
Michael J. Ohletz:
Floating body effects model for fault simulation of fully depleted CMOS/SOI circuits.
Microelectronics Journal 34(10): 889-895 (2003) |
| 2002 |
|---|
| 6 | EE | Daniela De Venuto,
Michael J. Ohletz,
Bruno Riccò:
Testing of Analogue Circuits via (Standard) Digital Gates.
ISQED 2002: 112-119 |
| 5 | EE | Daniela De Venuto,
Michael J. Ohletz,
Bruno Riccò:
Digital Window Comparator DfT Scheme for Mixed-Signal ICs.
J. Electronic Testing 18(2): 121-128 (2002) |
| 2001 |
|---|
| 4 | EE | Daniela De Venuto,
Michael J. Ohletz:
On-Chip Test for Mixed-Signal ASICs using Two-Mode Comparators with Bias-Programmable Reference Voltages.
J. Electronic Testing 17(3-4): 243-253 (2001) |
| 1998 |
|---|
| 3 | EE | A. Lechner,
Andrew Richardson,
B. Hermes,
Michael J. Ohletz:
A Design for Testability Study on a High Performance Automatic Gain Control Circuit.
VTS 1998: 376-385 |
| 1996 |
|---|
| 2 | | Michael J. Ohletz:
Realistic-Faults Mapping Scheme for the Fault Simulation of Integrated Analogue CMOS Circuits.
ITC 1996: 776-785 |
| 1985 |
|---|
| 1 | | F. Matthiesen,
Michael J. Ohletz:
Test of Digital Transversal Filters.
ITC 1985: 842-847 |
