Volume 2,
Number 1,
March 1991
- R. G. Bennetts, A. Osseyran:
IEEE standard 1149.1-1990 on boundary scan: History, literature survey, and current status.
11-25
Electronic Edition (link) BibTeX
- C. M. Maunder, Rodham E. Tulloss:
An introduction to the boundary scan standard: ANSI/IEEE Std 1149.1.
27-42
Electronic Edition (link) BibTeX
- Kenneth P. Parker, Stig Oresjo:
A language for describing boundary scan devices.
43-75
Electronic Edition (link) BibTeX
- Frans Jong, José S. Matos, José M. Ferreira:
Boundary scan test, test methodology, and fault modeling.
77-88
Electronic Edition (link) BibTeX
- Don Sterba, Andy Halliday, Don McClean:
ATPG and diagnostics for boards implementing boundary scan.
89-98
Electronic Edition (link) BibTeX
- Matthew L. Fichtenbaum, Gordon D. Robinson:
Scan test architectures for digital board testers.
99-105
Electronic Edition (link) BibTeX
- Bulent I. Dervisoglu:
Features of a Scan and Clock Resource chip for providing access to board-level test functions.
107-115
Electronic Edition (link) BibTeX
- Jung-Cheun Lien, Melvin A. Breuer:
An optimal scheduling algorithm for testing interconnect using boundary scan.
117-130
Electronic Edition (link) BibTeX
Volume 2,
Number 2,
June 1991
Volume 2,
Number 3,
August 1991
Volume 2,
Number 4,
November 1991
Copyright © Sat May 16 23:58:50 2009
by Michael Ley (ley@uni-trier.de)
