2006 | ||
---|---|---|
2 | EE | Ruifeng Guo, Subhasish Mitra, Enamul Amyeen, Jinkyu Lee, Srihari Sivaraj, Srikanth Venkataraman: Evaluation of Test Metrics: Stuck-at, Bridge Coverage Estimate and Gate Exhaustive. VTS 2006: 66-71 |
2004 | ||
1 | EE | Srikanth Venkataraman, Srihari Sivaraj, Enamul Amyeen, Sangbong Lee, Ajay Ojha, Ruifeng Guo: An Experimental Study of N-Detect Scan ATPG Patterns on a Processor. VTS 2004: 23-30 |
1 | Enamul Amyeen | [1] [2] |
2 | Ruifeng Guo | [1] [2] |
3 | Jinkyu Lee | [2] |
4 | Sangbong Lee | [1] |
5 | Subhasish Mitra | [2] |
6 | Ajay Ojha | [1] |
7 | Srikanth Venkataraman | [1] [2] |