Sangbong Lee

2004
2	EE	Enamul Amyeen, Srikanth Venkataraman, Ajay Ojha, Sangbong Lee: Evaluation of the Quality of N-Detect Scan ATPG Patterns on a Processor. ITC 2004: 669-678
1	EE	Srikanth Venkataraman, Srihari Sivaraj, Enamul Amyeen, Sangbong Lee, Ajay Ojha, Ruifeng Guo: An Experimental Study of N-Detect Scan ATPG Patterns on a Processor. VTS 2004: 23-30

Coauthor Index

1	Enamul Amyeen	[1] [2]
2	Ruifeng Guo	[1]
3	Ajay Ojha	[1] [2]
4	Srihari Sivaraj	[1]
5	Srikanth Venkataraman	[1] [2]