| 1998 |
|---|
| 6 | EE | Yiming Gong,
Sreejit Chakravarty:
Locating bridging faults using dynamically computed stuck-at fault dictionaries.
IEEE Trans. on CAD of Integrated Circuits and Systems 17(9): 876-887 (1998) |
| 1997 |
|---|
| 5 | EE | Yiming Gong,
Sreejit Chakravarty:
Using fault sampling to compute I/sub DDQ/ diagnostic test set.
VTS 1997: 74-79 |
| 1996 |
|---|
| 4 | EE | Sreejit Chakravarty,
Yiming Gong,
Srikanth Venkataraman:
Diagnostic simulation of stuck-at faults in combinational circuits.
J. Electronic Testing 8(1): 87-97 (1996) |
| 1995 |
|---|
| 3 | EE | Yiming Gong,
Sreejit Chakravarty:
On adaptive diagnostic test generation.
ICCAD 1995: 181-184 |
| 2 | EE | Sreejit Chakravarty,
Yiming Gong:
Voting model based diagnosis of bridging faults in combinational circuits.
VLSI Design 1995: 338-342 |
| 1993 |
|---|
| 1 | EE | Sreejit Chakravarty,
Yiming Gong:
An Algorithm for Diagnosing Two-Line Bridging Faults in Combinational Circuits.
DAC 1993: 520-524 |
