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Yiming Gong

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1998
6EEYiming Gong, Sreejit Chakravarty: Locating bridging faults using dynamically computed stuck-at fault dictionaries. IEEE Trans. on CAD of Integrated Circuits and Systems 17(9): 876-887 (1998)
1997
5EEYiming Gong, Sreejit Chakravarty: Using fault sampling to compute I/sub DDQ/ diagnostic test set. VTS 1997: 74-79
1996
4EESreejit Chakravarty, Yiming Gong, Srikanth Venkataraman: Diagnostic simulation of stuck-at faults in combinational circuits. J. Electronic Testing 8(1): 87-97 (1996)
1995
3EEYiming Gong, Sreejit Chakravarty: On adaptive diagnostic test generation. ICCAD 1995: 181-184
2EESreejit Chakravarty, Yiming Gong: Voting model based diagnosis of bridging faults in combinational circuits. VLSI Design 1995: 338-342
1993
1EESreejit Chakravarty, Yiming Gong: An Algorithm for Diagnosing Two-Line Bridging Faults in Combinational Circuits. DAC 1993: 520-524

Coauthor Index

1Sreejit Chakravarty [1] [2] [3] [4] [5] [6]
2Srikanth Venkataraman [4]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)