| |
| 1998 | ||
|---|---|---|
| 6 | EE | Yiming Gong, Sreejit Chakravarty: Locating bridging faults using dynamically computed stuck-at fault dictionaries. IEEE Trans. on CAD of Integrated Circuits and Systems 17(9): 876-887 (1998) |
| 1997 | ||
| 5 | EE | Yiming Gong, Sreejit Chakravarty: Using fault sampling to compute I/sub DDQ/ diagnostic test set. VTS 1997: 74-79 |
| 1996 | ||
| 4 | EE | Sreejit Chakravarty, Yiming Gong, Srikanth Venkataraman: Diagnostic simulation of stuck-at faults in combinational circuits. J. Electronic Testing 8(1): 87-97 (1996) |
| 1995 | ||
| 3 | EE | Yiming Gong, Sreejit Chakravarty: On adaptive diagnostic test generation. ICCAD 1995: 181-184 |
| 2 | EE | Sreejit Chakravarty, Yiming Gong: Voting model based diagnosis of bridging faults in combinational circuits. VLSI Design 1995: 338-342 |
| 1993 | ||
| 1 | EE | Sreejit Chakravarty, Yiming Gong: An Algorithm for Diagnosing Two-Line Bridging Faults in Combinational Circuits. DAC 1993: 520-524 |
| 1 | Sreejit Chakravarty | [1] [2] [3] [4] [5] [6] |
| 2 | Srikanth Venkataraman | [4] |