| |
| 2004 | ||
|---|---|---|
| 2 | EE | Enamul Amyeen, Srikanth Venkataraman, Ajay Ojha, Sangbong Lee: Evaluation of the Quality of N-Detect Scan ATPG Patterns on a Processor. ITC 2004: 669-678 |
| 1 | EE | Srikanth Venkataraman, Srihari Sivaraj, Enamul Amyeen, Sangbong Lee, Ajay Ojha, Ruifeng Guo: An Experimental Study of N-Detect Scan ATPG Patterns on a Processor. VTS 2004: 23-30 |
| 1 | Enamul Amyeen | [1] [2] |
| 2 | Ruifeng Guo | [1] |
| 3 | Sangbong Lee | [1] [2] |
| 4 | Srihari Sivaraj | [1] |
| 5 | Srikanth Venkataraman | [1] [2] |