2003 |
8 | EE | Abhijit Jas,
Jayabrata Ghosh-Dastidar,
Mom-Eng Ng,
Nur A. Touba:
An efficient test vector compression scheme using selective Huffman coding.
IEEE Trans. on CAD of Integrated Circuits and Systems 22(6): 797-806 (2003) |
2001 |
7 | EE | Jayabrata Ghosh-Dastidar,
Nur A. Touba:
Improving Diagnostic Resolution of Delay Faults in FPGAs by Exploiting Reconfigurability.
DFT 2001: 215-220 |
6 | EE | Ramesh C. Tekumalla,
Srikanth Venkataraman,
Jayabrata Ghosh-Dastidar:
On Diagnosing Path Delay Faults in an At-Speed Environment.
VTS 2001: 28-33 |
2000 |
5 | EE | Jayabrata Ghosh-Dastidar,
Nur A. Touba:
A Rapid and Scalable Diagnosis Scheme for BIST Environments with a Large Number of Scan Chains.
VTS 2000: 79-88 |
1999 |
4 | | Jayabrata Ghosh-Dastidar,
Debaleena Das,
Nur A. Touba:
Fault diagnosis in scan-based BIST using both time and space information.
ITC 1999: 95-102 |
3 | EE | Abhijit Jas,
Jayabrata Ghosh-Dastidar,
Nur A. Touba:
Scan Vector Compression/Decompression Using Statistical Coding.
VTS 1999: 114-120 |
2 | EE | Jayabrata Ghosh-Dastidar,
Nur A. Touba:
Adaptive Techniques for Improving Delay Fault Diagnosis.
VTS 1999: 168-172 |
1998 |
1 | EE | Jayabrata Ghosh-Dastidar,
Nur A. Touba:
A Systematic Approach for Diagnosing Multiple Delay Faults.
DFT 1998: 211-216 |