2006 |
5 | EE | David Abercrombie,
Bernd Koenemann,
Nagesh Tamarapalli,
Srikanth Venkataraman:
DFM, DFT, Silicon Debug and Diagnosis - The Loop to Ensure Product Yield.
VLSI Design 2006: 14 |
2005 |
4 | EE | Jay Jahangiri,
David Abercrombie:
Meeting Nanometer DPM Requirements Through DFT.
ISQED 2005: 276-282 |
3 | EE | Jay Jahangiri,
David Abercrombie:
Value-Added Defect Testing Techniques.
IEEE Design & Test of Computers 22(3): 224-231 (2005) |
2004 |
2 | EE | Manu Rehani,
David Abercrombie,
Robert Madge,
Jim Teisher,
Jason Saw:
ATE Data Collection - A comprehensive requirements proposal to maximize ROI of test.
ITC 2004: 181-189 |
2002 |
1 | EE | David Turner,
David Abercrombie,
James McNames,
W. Robert Daasch,
Robert Madge:
Isolating and Removing Sources of Variation in Test Data.
ITC 2002: 464-471 |