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F. Darlay

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1995
2 Mohamed Soufi, Yvon Savaria, F. Darlay, Bozena Kaminska: Producing Reliable Initialization and Test of Sequential Circuits with Pseudorandom Vectors. IEEE Trans. Computers 44(10): 1251-1256 (1995)
1990
1EEF. Darlay, B. Courtois: Robust tests for stuck-open faults and design for testability of reconvergent fan-out CMOS logic networks. EURO-DAC 1990: 344-349

Coauthor Index

1B. Courtois [1]
2Bozena Kaminska [2]
3Yvon Savaria [2]
4Mohamed Soufi [2]

Colors in the list of coauthors

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)