| |
| 1999 | ||
|---|---|---|
| 4 | EE | Abdessatar Abderrahman, Eduard Cerny, Bozena Kaminska: Worst case tolerance analysis and CLP-based multifrequency test generation for analog circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 18(3): 332-345 (1999) |
| 1997 | ||
| 3 | EE | Abdessatar Abderrahman, Eduard Cerny, Bozena Kaminska: CLP-based Multifrequency Test Generation for Analog Circuits. VTS 1997: 158-165 |
| 1996 | ||
| 2 | EE | Abdessatar Abderrahman, Bozena Kaminska, Eduard Cerny: Optimization-based multifrequency test generation for analog circuits. J. Electronic Testing 9(1-2): 59-73 (1996) |
| 1994 | ||
| 1 | Abdessatar Abderrahman, Bozena Kaminska, Yvon Savaria: Estimation of Simultaneous Switching Power and Ground Noise of Static CMOS Combinational Circuits. EDAC-ETC-EUROASIC 1994: 658 | |
| 1 | Eduard Cerny | [2] [3] [4] |
| 2 | Bozena Kaminska | [1] [2] [3] [4] |
| 3 | Yvon Savaria | [1] |