| |
| 2006 | ||
|---|---|---|
| 4 | EE | Jee-Youl Ryu, Bruce C. Kim, Iboun Taimiya Sylla: A Novel RF Test Scheme Based on a DFT Method. J. Electronic Testing 22(3): 229-237 (2006) |
| 2003 | ||
| 3 | EE | Iboun Taimiya Sylla: Building An RF Source For Low Cost Testers Using An ADPLL Controlled By Texas Instruments Digital Signal Processor (DSP) TMS320C5402. ITC 2003: 659-664 |
| 2001 | ||
| 2 | EE | Iboun Taimiya Sylla, Mustapha Slamani, Bozena Kaminska: A Unity Gain High Speed Buffer to Improve Signal Integrity in High Frequency Test Interface. J. Electronic Testing 17(1): 53-61 (2001) |
| 1998 | ||
| 1 | EE | Iboun Taimiya Sylla, Mustapha Slamani, Bozena Kaminska, Fartoumi M. Hossein, Patrick Vincent: Impedance Mismatch and Lumped Capacitance Effects in High Frequency Testing. VTS 1998: 239-244 |
| 1 | Fartoumi M. Hossein | [1] |
| 2 | Bozena Kaminska | [1] [2] |
| 3 | Bruce C. Kim | [4] |
| 4 | Jee-Youl Ryu | [4] |
| 5 | Mustapha Slamani | [1] [2] |
| 6 | Patrick Vincent | [1] |