| 2007 |
|---|
| 11 | EE | Julien Mercier,
Christian Dufaza,
Mathieu Lisart:
Signoff power methodology for contactless smartcards.
ISLPED 2007: 407-410 |
| 2006 |
|---|
| 10 | EE | Julien Mercier,
Christian Dufaza,
Mathieu Lisart:
Methodology for Dynamic Power Verification of Contactless Smartcards.
PATMOS 2006: 280-291 |
| 2002 |
|---|
| 9 | EE | W. Rahajandraibe,
Christian Dufaza,
Daniel Auvergne,
B. Cialdella,
B. Majoux,
V. Chowdhury:
Test Structure for IC(VBE) Parameter Determination of Low Voltage Applications.
DATE 2002: 316-321 |
| 1999 |
|---|
| 8 | EE | Christian Dufaza:
Multiple Paths Sensitization of Digital Oscillation Built-In Self Test.
ICCD 1999: 166-174 |
| 1998 |
|---|
| 7 | EE | Karim Arabi,
Hassan Ihs,
Christian Dufaza,
Bozena Kaminska:
Digital oscillation-test method for delay and stuck-at fault testing of digital circuits.
ITC 1998: 91-100 |
| 6 | EE | Christian Dufaza:
Theoretical properties of LFSRs for built-in self test.
Integration 25(1): 17-35 (1998) |
| 1997 |
|---|
| 5 | EE | Hassan Ihs,
Christian Dufaza:
Test synthesis for DC test of switched-capacitors circuits.
ED&TC 1997: 616 |
| 4 | EE | Christian Dufaza,
Yervant Zorian:
On the generation of pseudo-deterministic two-patterns test sequence with LFSRs.
ED&TC 1997: 69-76 |
| 3 | EE | Christian Dufaza,
Hassan Ihs:
Test Synthesis for DC Test and Maximal Diagnosis of Switched-Capacitor Circuits.
VTS 1997: 252-260 |
| 1996 |
|---|
| 2 | EE | Christian Dufaza,
Hassan Ihs:
A BIST-DFT technique for DC test of analog modules.
J. Electronic Testing 9(1-2): 117-133 (1996) |
| 1995 |
|---|
| 1 | EE | Hassan Ihs,
Christian Dufaza:
Tolerance DC bands of CMOS operational amplifier.
Asian Test Symposium 1995: 140- |
