| 2001 |
|---|
| 12 | EE | Khaled Saab,
Naim Ben Hamida,
Bozena Kaminska:
Closing the gap between analog and digital testing.
IEEE Trans. on CAD of Integrated Circuits and Systems 20(2): 307-314 (2001) |
| 2000 |
|---|
| 11 | EE | Khaled Saab,
Naim Ben Hamida,
Bozena Kaminska:
Closing the gap between analog and digital.
DAC 2000: 774-779 |
| 10 | EE | Khaled Saab,
Naim Ben Hamida,
Bozena Kaminska:
Parametric Fault Simulation and Test Vector Generation.
DATE 2000: 650- |
| 1997 |
|---|
| 9 | EE | Naim Ben Hamida,
Khaled Saab,
David Marche,
Bozena Kaminska:
A perturbation based fault modeling and simulation for mixed-signal circuits.
Asian Test Symposium 1997: 182-187 |
| 1996 |
|---|
| 8 | EE | Naim Ben Hamida,
Bechir Ayari,
Bozena Kaminska:
Testing of embedded A/D converters in mixed-signal circuit.
ICCD 1996: 135-136 |
| 7 | | Naim Ben Hamida,
Khaled Saab,
David Marche,
Bozena Kaminska,
Guy Quesnel:
LIMSoft: Automated Tool for Design and Test Integration of Analog Circuits.
ITC 1996: 571-580 |
| 1994 |
|---|
| 6 | | Naim Ben Hamida,
Bozena Kaminska,
Yvon Savaria:
Pseudo-Random Vector Compaction for Sequential Testability.
ISCAS 1994: 63-66 |
| 5 | | Naim Ben Hamida,
Bozena Kaminska:
High Level Synthesis with Testability Constraints.
ISCAS 1994: 65-68 |
| 4 | | Naim Ben Hamida,
Bozena Kaminska:
Multiple Fault Testing in Analog Circuits.
VLSI Design 1994: 61-66 |
| 1993 |
|---|
| 3 | | Naim Ben Hamida,
Bozena Kaminska,
Yvon Savaria:
Initiability: A Measure of Sequential Testability.
ISCAS 1993: 1619-1622 |
| 2 | | Naim Ben Hamida,
Bozena Kaminska:
Analog Circuit Testing Based on Sensitivity Computation and New Circuit Modeling.
ITC 1993: 652-661 |
| 1 | EE | Naim Ben Hamida,
Bozena Kaminska:
Multiple fault analog circuit testing by sensitivity analysis.
J. Electronic Testing 4(4): 331-343 (1993) |
