| |
| 1999 | ||
|---|---|---|
| 4 | EE | Samir Boubezari, Eduard Cerny, Bozena Kaminska, Benoit Nadeau-Dostie: Testability analysis and test-point insertion in RTL VHDL specifications for scan-based BIST. IEEE Trans. on CAD of Integrated Circuits and Systems 18(9): 1327-1340 (1999) |
| 1996 | ||
| 3 | EE | Samir Boubezari, Bozena Kaminska: A new reconfigurable Test Vector Generator for built-in self-test applications. J. Electronic Testing 8(2): 153-164 (1996) |
| 1995 | ||
| 2 | Samir Boubezari, Bozena Kaminska: Mixed Deterministic and Pseudorandom Test Vector Generator Based on Cellular Automata Structures. ISCAS 1995: 1928-1931 | |
| 1 | Samir Boubezari, Bozena Kaminska: A Deterministic Built-In-Self-Test Generator Based on Cellular Automata Structures. IEEE Trans. Computers 44(6): 805-816 (1995) | |
| 1 | Eduard Cerny | [4] |
| 2 | Bozena Kaminska | [1] [2] [3] [4] |
| 3 | Benoit Nadeau-Dostie | [4] |