Mustapha Slamani

2007
15	EE	Haralampos-G. D. Stratigopoulos, Petros Drineas, Mustapha Slamani, Yiorgos Makris: Non-RF to RF Test Correlation Using Learning Machines: A Case Study. VTS 2007: 9-14
14	EE	Dana Brown, John Ferrario, Randy Wolf, Jing Li, Jayendra Bhagat, Mustapha Slamani: RF Testing on a Mixed Signal Tester. J. Electronic Testing 23(1): 85-94 (2007)
2006
13	EE	André Boyoguéno, Mohamad Sawan, Mustapha Slamani: A BICMOS 120 MW 11 GHZ transimpedance amplifier Dedicated for High-Speed Photoreceivers. Journal of Circuits, Systems, and Computers 15(4): 467-490 (2006)
2004
12		Carol Stolicny, Mustapha Slamani, Fidel Muradali, Geir Eide, Mike Li: ITC 2003 panels: Part 2. IEEE Design & Test of Computers 21(3): 175-176 (2004)
2003
11	EE	Mustapha Slamani: RF Test 101: Defining the Problem, Finding Solutions. ITC 2003: 1286
2002
10	EE	Mustapha Slamani: Testing Highly Integrated Wireless Circuits and Systems with Low Cost Tester: How to Overcome the Challenge? ITC 2002: 1225
9	EE	Robert C. Aitken, Mustapha Slamani, H. Ding, William R. Eisenstadt, Sanghoon Choi, John McLaughlin: Wireless Test. VTS 2002: 173-174
2001
8	EE	Iboun Taimiya Sylla, Mustapha Slamani, Bozena Kaminska: A Unity Gain High Speed Buffer to Improve Signal Integrity in High Frequency Test Interface. J. Electronic Testing 17(1): 53-61 (2001)
7	EE	Mustapha Slamani, Karim Arabi: Reducing Test Time in the High-Volume Production of Analog Circuits using Efficient Test-Vector Generation and Interpolation Techniques. J. Electronic Testing 17(5): 417-425 (2001)
1999
6	EE	Abdelouahab Djemouai, Mohamad Sawan, Mustapha Slamani: An efficient RF power transfer and bidirectional data transmission to implantable electronic devices. ISCAS (2) 1999: 259-262
5	EE	Abdelouahab Djemouai, Mohamad Sawan, Mustapha Slamani: A 200 MHz frequency-locked loop based on new frequency-to-voltage converters approach. ISCAS (2) 1999: 89-92
1998
4	EE	Iboun Taimiya Sylla, Mustapha Slamani, Bozena Kaminska, Fartoumi M. Hossein, Patrick Vincent: Impedance Mismatch and Lumped Capacitance Effects in High Frequency Testing. VTS 1998: 239-244
1995
3	EE	Mustapha Slamani, Bozena Kaminska: Multifrequency Analysis of Faults in Analog Circuits. IEEE Design & Test of Computers 12(2): 70-80 (1995)
1994
2		Mustapha Slamani, Bozena Kaminska, Guy Quesnel: An Integrated Approach for Analog Ciruit Testing with a Minmum Number of Detected Parameters. ITC 1994: 631-640
1992
1	EE	Mustapha Slamani, Bozena Kaminska: Analog Circuit Fault Diagnosis Based on Sensitivity Computation and Functional Testing. IEEE Design & Test of Computers 9(1): 30-39 (1992)

Coauthor Index

1	Robert C. Aitken	[9]
2	Karim Arabi	[7]
3	Jayendra Bhagat	[14]
4	André Boyoguéno	[13]
5	Dana Brown	[14]
6	Sanghoon Choi	[9]
7	H. Ding	[9]
8	Abdelouahab Djemouai	[5] [6]
9	Petros Drineas	[15]
10	Geir Eide	[12]
11	William R. Eisenstadt	[9]
12	John Ferrario	[14]
13	Fartoumi M. Hossein	[4]
14	Bozena Kaminska	[1] [2] [3] [4] [8]
15	Jing Li	[14]
16	Mike Li	[12]
17	Yiorgos Makris	[15]
18	John McLaughlin	[9]
19	Fidel Muradali	[12]
20	Guy Quesnel	[2]
21	Mohamad Sawan	[5] [6] [13]
22	Carol Stolicny	[12]
23	Haralampos-G. D. Stratigopoulos	[15]
24	Iboun Taimiya Sylla	[4] [8]
25	Patrick Vincent	[4]
26	Randy Wolf	[14]

Colors in the list of coauthors