| 2001 |
|---|
| 6 | EE | Khaled Saab,
Naim Ben Hamida,
Bozena Kaminska:
Closing the gap between analog and digital testing.
IEEE Trans. on CAD of Integrated Circuits and Systems 20(2): 307-314 (2001) |
| 2000 |
|---|
| 5 | EE | Khaled Saab,
Naim Ben Hamida,
Bozena Kaminska:
Closing the gap between analog and digital.
DAC 2000: 774-779 |
| 4 | EE | Khaled Saab,
Naim Ben Hamida,
Bozena Kaminska:
Parametric Fault Simulation and Test Vector Generation.
DATE 2000: 650- |
| 1997 |
|---|
| 3 | EE | Naim Ben Hamida,
Khaled Saab,
David Marche,
Bozena Kaminska:
A perturbation based fault modeling and simulation for mixed-signal circuits.
Asian Test Symposium 1997: 182-187 |
| 1996 |
|---|
| 2 | | Naim Ben Hamida,
Khaled Saab,
David Marche,
Bozena Kaminska,
Guy Quesnel:
LIMSoft: Automated Tool for Design and Test Integration of Analog Circuits.
ITC 1996: 571-580 |
| 1995 |
|---|
| 1 | EE | Khaled Saab,
Bozena Kaminska,
Bernard Courtois,
Marcelo Lubaszewski:
Frequency-based BIST for analog circuit testin.
VTS 1995: 54-59 |
